Download Design Methodology for RF CMOS Phase Locked Loops by Carlos Quemada PDF

By Carlos Quemada

Engineers face stiff demanding situations in designing phase-locked loop (PLL) circuits for instant communications because of section noise and different hindrances. This sensible e-book involves the rescue with a confirmed PLL layout and optimization technique that shall we designers examine their ideas, are expecting PLL habit, and enhance reasonably-priced PLLs that meet functionality specifications it doesn't matter what IC (integrated circuit) demanding situations they arrive up opposed to. This uniquely finished toolkit takes designers step by step via operation rules, layout systems, section noise research, format issues, and CMOS realizations for every PLL construction block. It offers a pattern layout of a completely built-in PLL for WLAN purposes, demonstrating each step from specifications definition and circuit characterization to format iteration and circuit schematics.

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For PLLs, where these currents are in the order of ␮ A, this is a reasonable assumption. However, the most part of currently available synthesizers present current leakage in the order of 1 nA or less, and this is why other factors tend to dominate except when they are at very low reference frequencies. The charge pump in a locked loop condition is inactive most of the time. It activates for short periods generating positive and negative current pulses that do not change the control voltage of the VCO but cause a jitter in its tuning path.

Design of Analog CMOS Integrated Circuits, New York: McGraw-Hill, 2001. , RF Microelectronics, Upper Saddle River, NJ: Prentice-Hall, 1998. Rohde, U. , and D. P. Newkirk, RF/Microwave Circuit Design for Wireless Applications, New York: Wiley-Interscience, 2000. Sedra, A. , and K. C. , New York: Oxford University Press, 1998. References [1] Lee, T. , The Design of CMOS Radio Frequency Integrated Circuits, New York: Cambridge University Press, 1998. [2] Kolding, T. , Calculation of MOSFET Gate Impedance, Technical Report R98-1009, RISC Group, Aalborg University, ISSN 0908-1224, August 1998.

These limitations make it crucial an in-depth study of the technology characteristics take place before the design of the PLL starts. In many instances, even the development of a complete library of passive components is worth the effort, because it will save on development time and will limit the number of unsuccessful fabrication runs. 18 ␮ m is presented. The microphotograph shows the inductor with the test structure required to individually characterize the component. In the following sections we are going to outline the most relevant ideas about models and different implementations.

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